dc.contributor.author | Symeou, E. | en |
dc.contributor.author | Pervolaraki, M. | en |
dc.contributor.author | Mihailescu, C. N. | en |
dc.contributor.author | Athanasopoulos, G. I. | en |
dc.contributor.author | Papageorgiou, C. | en |
dc.contributor.author | Kyratsi, Theodora | en |
dc.contributor.author | Giapintzakis, John | en |
dc.creator | Symeou, E. | en |
dc.creator | Pervolaraki, M. | en |
dc.creator | Mihailescu, C. N. | en |
dc.creator | Athanasopoulos, G. I. | en |
dc.creator | Papageorgiou, C. | en |
dc.creator | Kyratsi, Theodora | en |
dc.creator | Giapintzakis, John | en |
dc.date.accessioned | 2019-05-06T12:24:44Z | |
dc.date.available | 2019-05-06T12:24:44Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/48888 | |
dc.description.abstract | We report on the pulsed laser deposition of p-type Bi0.5Sb1.5Te3 thin films onto fused silica substrates by ablation of dense targets of Bi0.5Sb1.5Te3 with an excess of 1 wt% Te. We investigated the effect of film thickness, substrate temperature and post-annealing duration on the thermoelectric properties of the films. Our results show that the best power factor (2780 μW/K2m at 300 K) is obtained for films grown at room temperature and then post-annealed in vacuum at 300 °C for 16 h. This is among the highest power factor values reported for Bi0.5Sb1.5Te3 films grown on fused silica substrates. © 2014 Elsevier B.V. All rights reserved. | en |
dc.language.iso | eng | en |
dc.source | Applied Surface Science | en |
dc.subject | Thermoelectricity | en |
dc.subject | Pulsed laser deposition | en |
dc.subject | Thin films | en |
dc.subject | Deposition | en |
dc.subject | Substrates | en |
dc.subject | Pulsed lasers | en |
dc.subject | Room temperature | en |
dc.subject | Thermoelectric properties | en |
dc.subject | Thermoelectric equipment | en |
dc.subject | Electric power factor | en |
dc.subject | Power factors | en |
dc.subject | Substrate temperature | en |
dc.subject | Annealing | en |
dc.subject | Bismuth antimony telluride | en |
dc.subject | Bismuth-antimony telluride | en |
dc.subject | Fused silica | en |
dc.subject | Fused silica substrates | en |
dc.subject | In-vacuum | en |
dc.subject | Post annealing | en |
dc.subject | Silica | en |
dc.title | Thermoelectric properties of Bi0.5Sb1.5Te3 thin films grown by pulsed laser deposition | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1016/j.apsusc.2014.10.038 | |
dc.description.volume | 336 | |
dc.description.startingpage | 138 | |
dc.description.endingpage | 142 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering | |
dc.type.uhtype | Article | en |
dc.contributor.orcid | Giapintzakis, John [0000-0002-7277-2662] | |
dc.contributor.orcid | Kyratsi, Theodora [0000-0003-2916-1708] | |
dc.description.totalnumpages | 138-142 | |
dc.gnosis.orcid | 0000-0002-7277-2662 | |
dc.gnosis.orcid | 0000-0003-2916-1708 | |