| dc.contributor.author | Seas, Antonios | en |
| dc.contributor.author | Christofides, Constantinos | en |
| dc.contributor.editor | Christofides, C. Ghibaudo,G. | en |
| dc.creator | Seas, Antonios | en |
| dc.creator | Christofides, Constantinos | en |
| dc.date.accessioned | 2019-12-02T15:32:35Z | |
| dc.date.available | 2019-12-02T15:32:35Z | |
| dc.date.issued | 1997 | |
| dc.identifier.issn | 0080-8784 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/59036 | |
| dc.source | Semiconductors and Semimetals | en |
| dc.subject | DAMAGE | en |
| dc.subject | TRANSPORT | en |
| dc.subject | DEFECTS | en |
| dc.subject | GAAS | en |
| dc.subject | KINETICS | en |
| dc.subject | PROFILES | en |
| dc.subject | REFRACTIVE-INDEXES | en |
| dc.subject | ANNEALED SILICON LAYERS | en |
| dc.subject | DOPED SILICON | en |
| dc.subject | IMPLANTATIONS | en |
| dc.title | Transmission and reflection spectroscopy on ion implanted semiconductors | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.description.volume | 46 | |
| dc.description.startingpage | 39 | |
| dc.description.endingpage | 71 | |
| dc.author.faculty | Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences | |
| dc.author.department | Τμήμα Φυσικής / Department of Physics | |
| dc.type.uhtype | Article | en |
| dc.description.notes | <p>PT: S | en |
| dc.description.notes | TC: 3 | en |
| dc.description.notes | J9: SEMICONDUCT SEMIMET</p> | en |
| dc.source.abbreviation | Semicond.Sdemimet. | en |
| dc.contributor.orcid | Christofides, Constantinos [0000-0002-4020-4660] | |
| dc.gnosis.orcid | 0000-0002-4020-4660 | |
