| dc.contributor.author | Nestoros, Marios | en |
| dc.contributor.author | FORGET, BC | en |
| dc.contributor.author | Christofides, Constantinos | en |
| dc.contributor.author | Seas, Antonios | en |
| dc.creator | Nestoros, Marios | en |
| dc.creator | FORGET, BC | en |
| dc.creator | Christofides, Constantinos | en |
| dc.creator | Seas, Antonios | en |
| dc.date.accessioned | 2019-12-02T15:32:03Z | |
| dc.date.available | 2019-12-02T15:32:03Z | |
| dc.date.issued | 1995 | |
| dc.identifier.issn | 1098-0121 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/58911 | |
| dc.source | Physical Review B | en |
| dc.subject | ION-IMPLANTATION | en |
| dc.subject | OPTICAL REFLECTANCE | en |
| dc.subject | SEMICONDUCTORS | en |
| dc.subject | TRANSPORT | en |
| dc.subject | WAFERS | en |
| dc.subject | SPECTROSCOPY | en |
| dc.subject | DEFECTS | en |
| dc.subject | ANNEALING KINETICS | en |
| dc.subject | ARSENIC-IMPLANTED SILICON | en |
| dc.subject | THERMAL WAVES | en |
| dc.title | Photothermal Reflection Versus Temperature - Quantitative-Analysis | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.identifier.doi | 10.1103/PhysRevB.51.14115 | |
| dc.description.volume | 51 | |
| dc.description.issue | 20 | |
| dc.description.startingpage | 14115 | |
| dc.description.endingpage | 14123 | |
| dc.author.faculty | Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences | |
| dc.author.department | Τμήμα Φυσικής / Department of Physics | |
| dc.type.uhtype | Article | en |
| dc.description.notes | <p>PT: J | en |
| dc.description.notes | TC: 30 | en |
| dc.description.notes | J9: PHYS REV B</p> | en |
| dc.source.abbreviation | Phys.Rev.B | en |
| dc.contributor.orcid | Nestoros, Marios [0000-0002-2343-4771] | |
| dc.contributor.orcid | Christofides, Constantinos [0000-0002-4020-4660] | |
| dc.gnosis.orcid | 0000-0002-2343-4771 | |
| dc.gnosis.orcid | 0000-0002-4020-4660 | |
